Articles and blogs

Image of Jumpstart Ethernet-APL Field-Device Designs with ADI's Reference Platform Jumpstart Ethernet-APL Field-Device Designs with ADI Reference Platform Publish Date: 2026-10-15

Using Ethernet-APL and 10BASE-T1L to connect intrinsically safe field instruments to Ethernet-based process automation networks.

Image of Hysteresis Hysterics - The Hidden Controls Scheme Behind Everyday Life Hysteresis Hysterics - The Hidden Controls Scheme Behind Everyday Life

Having some hysteresis in our lives is what keeps things running smoothly, keeps devices running efficiently, and allows our devices to make decisions even when there's no one around.

Image of How to Apply an AI Agent to Accelerate Test Generation How to Apply an AI Agent to Accelerate Test Generation Publish Date: 2026-10-06

Learn how NI’s Nigel AI enhances test engineering software for higher test productivity.

Image of How to Select Hall Effect Sensors for Harsh Environments How to Select Hall Effect Sensors for Harsh Environments Publish Date: 2026-08-26

Rugged Hall effect switches and latches simplify closure, valve, and motor sensing in automotive and industrial systems.

Image of Selecting Thick-Film Thermistors for Fast-Response Temperature Sensing in Harsh Environments Selecting Thick-Film Thermistors for Fast-Response Temperature Sensing in Harsh Environments

Learn the basics of selecting thick-film thermistors for reliable and fast temperature sensing in harsh automotive, industrial, and medical applications.

Image of MEMS Sensors Must Survive Both Shock and Vibration MEMS Sensors Must Survive Both Shock and Vibration Publish Date: 2026-07-30

MEMS accelerometer shock ratings alone do not ensure vibration durability; see how ADI evaluates mechanical headroom and vibration operating limits.

Image of Maintaining System Availability and Data Integrity in Industrial Automation Applications Maintaining System Availability and Data Integrity in Industrial Automation Applications Publish Date: 2026-07-28

Phoenix Contact TRIO3 capacity modules offer several key benefits for powering and protecting PLCs, IPCs, I/O, HMI panels, and other 24 VDC DIN-rail equipment.

Image of Webinar – 5 Ways AI Is Changing Electronic Design and Test Webinar – 5 Ways AI Is Changing Electronic Design and Test

Learn how AI can create a meaningful impact across system design, measurement automation, test sequence management, and data analysis.

Image of Reducing Downtime in Distributed 24 VDC Control Systems Reducing Downtime in Distributed 24 VDC Control Systems Publish Date: 2026-07-16

Selective electronic circuit protection improves fault isolation, uptime, and troubleshooting in compact 24 VDC control systems.

Image of XRP Classroom Triage and Troubleshooting guide XRP Classroom Triage and Troubleshooting guide

If you've ever stood in front of a classroom full of students while an XRP robot starts driving in unexpected circles and you're not entirely sure why — this post is for you.

Image of The Acute Need for Software Automation in Modern Test Labs The Acute Need for Software Automation in Modern Test Labs Publish Date: 2026-07-08

Discover how software automation, AI, and NI tools help modern test labs improve coverage, repeatability, data access, and engineering productivity.

Image of Debug with the Confidence of 12-Bit Waveform Visibility Debug with the Confidence of 12-Bit Waveform Visibility Publish Date: 2026-07-08

A 12-bit high-definition oscilloscope gives engineers finer visibility into small signal variations riding on larger waveforms.

Image of Handheld Digital Multimeters for Modern Industrial Troubleshooting Handheld Digital Multimeters for Modern Industrial Troubleshooting Publish Date: 2026-07-08

Industrial electrical troubleshooting often draw non-sinusoidal current waveforms. The True RMS value of distorted waveforms needs to be measured.

Image of Enhance Industrial Safety with Long-Life, Pre-Calibrated Hydrocarbon Gas Sensors Enhance Industrial Safety with Long-Life, Pre-Calibrated Hydrocarbon Gas Sensors Publish Date: 2026-06-24

Learn how the Honeywell 4 Series C1N-2654-40D NDIR hydrocarbon gas sensor enables accurate monitoring of gas concentrations for industrial safety applications.

Image of How to Extend the Industrial Edge with SPE and PoDL How to Extend the Industrial Edge with SPE and PoDL Publish Date: 2026-06-23

ADI's ADIN1110 MAC-PHY enables 10BASE-T1L SPE and PODL, simplifying industrial sensor deployment by reducing cabling and costs for condition-based monitoring.

Image of Simplify Direct Time-of-Flight Receiver Design with an Integrated Current-to-Bits Module Simplify Direct Time-of-Flight Receiver Design with an Integrated Current-to-Bits Module Publish Date: 2026-06-16

An integrated current-to-bits receiver simplifies time-of-flight designs by consolidating the essential transimpedance amplifier, filter, and converter chain.

Image of How Temperature Affects Electronic Components How Temperature Affects Electronic Components

When I first started working on electronic projects, temperature was the last thing on my mind. I was so focused on getting my circuits to work, making sure the wiring was right, the code ran, and the sensors were giving me the right values.

Image of Resistor-Integrated Microswitches Improve System Reliability Through Four-State Detection Resistor-Integrated Microswitches Improve System Reliability Through Four-State Detection Publish Date: 2026-04-21

Resistor-integrated microswitches simplify wiring and improve system reliability with four-state detection for self-diagnosis and remote fault monitoring.

Image of Detecting High-Impedance Ground Faults: Limitations of Standard GFDI and Active Diagnostic Solutions Detecting High-Impedance Ground Faults: Limitations of Standard GFDI and Active Diagnostic Solutions Publish Date: 2026-03-18

An examination of the limitations of standard GFDI, the physics of high-impedance faults, and the practical challenges of locating them in 1500 V arrays.

Image of Use a Dual-Path ADC Architecture for Low-Noise Wideband Signal Capture Use a Dual-Path ADC Architecture for Low-Noise Wideband Signal Capture Publish Date: 2026-02-19

Learn how a dual-path 10 Gsamples/s ADC architecture can be used to achieve accurate low-noise signal digitization from DC to 5 GHz.