Jumpstart Ethernet-APL Field-Device Designs with ADI Reference Platform
Publish Date: 2026-10-15
Using Ethernet-APL and 10BASE-T1L to connect intrinsically safe field instruments to Ethernet-based process automation networks.
Hysteresis Hysterics - The Hidden Controls Scheme Behind Everyday Life
Having some hysteresis in our lives is what keeps things running smoothly, keeps devices running efficiently, and allows our devices to make decisions even when there's no one around.
How to Apply an AI Agent to Accelerate Test Generation
Publish Date: 2026-10-06
Learn how NI’s Nigel AI enhances test engineering software for higher test productivity.
How to Select Hall Effect Sensors for Harsh Environments
Publish Date: 2026-08-26
Rugged Hall effect switches and latches simplify closure, valve, and motor sensing in automotive and industrial systems.
Selecting Thick-Film Thermistors for Fast-Response Temperature Sensing in Harsh Environments
Learn the basics of selecting thick-film thermistors for reliable and fast temperature sensing in harsh automotive, industrial, and medical applications.
MEMS Sensors Must Survive Both Shock and Vibration
Publish Date: 2026-07-30
MEMS accelerometer shock ratings alone do not ensure vibration durability; see how ADI evaluates mechanical headroom and vibration operating limits.
Maintaining System Availability and Data Integrity in Industrial Automation Applications
Publish Date: 2026-07-28
Phoenix Contact TRIO3 capacity modules offer several key benefits for powering and protecting PLCs, IPCs, I/O, HMI panels, and other 24 VDC DIN-rail equipment.
Webinar – 5 Ways AI Is Changing Electronic Design and Test
Learn how AI can create a meaningful impact across system design, measurement automation, test sequence management, and data analysis.
Reducing Downtime in Distributed 24 VDC Control Systems
Publish Date: 2026-07-16
Selective electronic circuit protection improves fault isolation, uptime, and troubleshooting in compact 24 VDC control systems.
XRP Classroom Triage and Troubleshooting guide
If you've ever stood in front of a classroom full of students while an XRP robot starts driving in unexpected circles and you're not entirely sure why — this post is for you.
The Acute Need for Software Automation in Modern Test Labs
Publish Date: 2026-07-08
Discover how software automation, AI, and NI tools help modern test labs improve coverage, repeatability, data access, and engineering productivity.
Debug with the Confidence of 12-Bit Waveform Visibility
Publish Date: 2026-07-08
A 12-bit high-definition oscilloscope gives engineers finer visibility into small signal variations riding on larger waveforms.
Handheld Digital Multimeters for Modern Industrial Troubleshooting
Publish Date: 2026-07-08
Industrial electrical troubleshooting often draw non-sinusoidal current waveforms. The True RMS value of distorted waveforms needs to be measured.
Enhance Industrial Safety with Long-Life, Pre-Calibrated Hydrocarbon Gas Sensors
Publish Date: 2026-06-24
Learn how the Honeywell 4 Series C1N-2654-40D NDIR hydrocarbon gas sensor enables accurate monitoring of gas concentrations for industrial safety applications.
How to Extend the Industrial Edge with SPE and PoDL
Publish Date: 2026-06-23
ADI's ADIN1110 MAC-PHY enables 10BASE-T1L SPE and PODL, simplifying industrial sensor deployment by reducing cabling and costs for condition-based monitoring.
Simplify Direct Time-of-Flight Receiver Design with an Integrated Current-to-Bits Module
Publish Date: 2026-06-16
An integrated current-to-bits receiver simplifies time-of-flight designs by consolidating the essential transimpedance amplifier, filter, and converter chain.
How Temperature Affects Electronic Components
When I first started working on electronic projects, temperature was the last thing on my mind. I was so focused on getting my circuits to work, making sure the wiring was right, the code ran, and the sensors were giving me the right values.
Resistor-Integrated Microswitches Improve System Reliability Through Four-State Detection
Publish Date: 2026-04-21
Resistor-integrated microswitches simplify wiring and improve system reliability with four-state detection for self-diagnosis and remote fault monitoring.
Detecting High-Impedance Ground Faults: Limitations of Standard GFDI and Active Diagnostic Solutions
Publish Date: 2026-03-18
An examination of the limitations of standard GFDI, the physics of high-impedance faults, and the practical challenges of locating them in 1500 V arrays.
Use a Dual-Path ADC Architecture for Low-Noise Wideband Signal Capture
Publish Date: 2026-02-19
Learn how a dual-path 10 Gsamples/s ADC architecture can be used to achieve accurate low-noise signal digitization from DC to 5 GHz.

